Article ID Journal Published Year Pages File Type
1824982 Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2011 4 Pages PDF
Abstract
For investigation of fundamental aspects of secondary ion mass spectrometry (SIMS) such as secondary ion distributions, roughness formation or simply for optimisation of a particular analysis, the ability to tilt a sample is vital. However many instruments suffer transmission losses when the sample is tilted. This phenomenon has been investigated for the Cation Mass Spectrometer (CMS) instrument using Monte Carlo simulations and the cause determined to be modification of the extraction field arising from the sample tilt. A new sample holder incorporating biasing electrodes has been developed to eliminate transmission losses during SIMS analysis when using tilted samples. Simulations and experimental result confirm complete elimination of transmission losses for sample tilts of up to 20°.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Instrumentation
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