Article ID Journal Published Year Pages File Type
1825009 Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2011 6 Pages PDF
Abstract

In this report, we briefly describe the general design principles and construction of a newly developed ambient pressure X-ray photoelectron spectroscopy system. This system provides an imaging mode with <20 μm spatial resolution in one dimension as well as an angle-resolved mode. The new imaging mode enables us to study structured surfaces under catalytically and environmentally relevant conditions. To illustrate this capability, in situ studies on a Au–SiO2 heterojunction and Rh–TiO2 metal–support system are presented. This new system can probe structured surfaces near ambient pressure as a function of temperature, pressure, electrical potential, local position, and time. It is a valuable in situ tool to detect material transformations at the micrometer scale.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Instrumentation
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