Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1825124 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2011 | 6 Pages |
Abstract
An X-ray fluorescence computed tomography system (XRF-CT) is useful for determining the main atoms in objects. To detect iodine atoms without using a synchrotron, we developed an XRF-CT system utilizing a cadmium telluride (CdTe) detector and a cerium X-ray generator. CT is performed by repeated linear scans and rotations of an object. When cerium K-series characteristic X-rays are absorbed by iodine atoms in objects, iodine K fluorescence is produced from atoms and is detected by the CdTe detector. Next, event signals of X-ray photons are produced with the use of charge-sensitive and shaping amplifiers. Iodine Kα fluorescence is isolated using a multichannel analyzer, and the number of photons is counted using a counter card. In energy-dispersive XRF-CT, the tube voltage and tube current were 70 kV and 0.40 mA, respectively, and the X-ray intensity was 115.3 μGy/s at a distance of 1.0 m from the source. The demonstration of XRF-CT was carried out by the selection of photons in an energy range from 27.5 to 29.5 keV with a photon-energy resolution of 1.2 keV.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Osahiko Hagiwara, Manabu Watanabe, Eiichi Sato, Hiroshi Matsukiyo, Akihiro Osawa, Toshiyuki Enomoto, Jiro Nagao, Shigehiro Sato, Akira Ogawa, Jun Onagawa,