| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1825458 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2011 | 4 Pages |
Abstract
Plastically deformed Si-crystal wafers were characterized by monochromatic neutron diffraction. During the cylindrically curved deformation, a resolution-limit Bragg peak changes into a box-type angular profile in accordance with the bulk curvature, associated with an enhancement in the angle-integrated intensity (IθIθ). Stacking such wafers is efficient in amplifying IθIθ further. We propose an application to neutron-focusing monochromator (or analyzer) crystals in order to design a quite compact spectrometer.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
H. Hiraka, K. Fujiwara, K. Yamada, K. Morishita, K. Nakajima,