Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1825708 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2011 | 4 Pages |
Abstract
A direct detection X-ray imager is presented. It uses polycrystalline cadmium telluride (CdTe) grown by close space sublimation technique for the X-ray photoconductor. A 15Â mmÃ15Â mm CdTe layer is connected to a 200Ã200 pixel readout CMOS by indium bumping. X-ray performance at 16Â frames/s rate is measured. In particular a readout noise of 0.5 X-ray, an MTF of 50% at 4Â lp/mm and a DQE of 20% at 4Â lp/mm are obtained.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Marc Arques, Sébastien Renet, Andréa Brambilla, Guy Feuillet, Adrien Gasse, Nicolas Billon-Pierron, Muriel Jolliot, Lydie Mathieu, Pierre Rohr,