Sub-nanosecond time-of-flight for segmented silicon detectors

Article ID	Journal	Published Year	Pages	File Type
1826267	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment	2011	4 Pages	PDF

Abstract

Development of a multichannel time-of-flight system for readout of a segmented, ion-passivated, ion-implanted silicon detector is described. This system provides sub-nanosecond resolution (δt≈370ps) even for low energy αα particles which deposit E≤7.687MeV in the detector.

Keywords

Fast timing Time-of-Flight

Related Topics

Physical Sciences and Engineering Physics and Astronomy Instrumentation

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Sub-nanosecond time-of-flight for segmented silicon detectors

Authors

R.T. deSouza, A. Alexander, K. Brown, B. Floyd, Z.Q. Gosser, S. Hudan, J. Poehlman, M.J. Rudolph,