| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1826620 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2010 | 5 Pages |
Abstract
We describe the hard X-ray scanning microscope planned for the new synchrotron radiation source PETRA III at DESY in Hamburg, Germany. It is based on nanofocusing refractive X-ray lenses and is designed for two-dimensional mapping and scanning tomography. It supports X-ray fluorescence and (coherent) diffraction contrast, yielding elemental and structural information from inside the sample. Spatial resolutions down to well below 50 nm are aimed for in direct space. A further increase in spatial resolution is expected by applying ptychographic scanning schemes. The optical scheme with a two-stage focusing optic is described.
Related Topics
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Instrumentation
Authors
Christian G. Schroer, Pit Boye, Jan M. Feldkamp, Jens Patommel, Dirk Samberg, Andreas Schropp, Andreas Schwab, Sandra Stephan, Gerald Falkenberg, Gerd Wellenreuther, Nadja Reimers,