Systematic effects in pulse shape analysis of HPGe detector signals for 0νββ0νββ

Pulse shape analysis is an important background reduction and signal identification technique for next generation of 76Ge 0νββ0νββ experiments. We present a study of the systematic uncertainties in one such parametric pulse-shape analysis technique for separating multi-site background from single-site signal events. We examined systematic uncertainties for events in full-energy gamma peaks (predominantly multi-site), double-escape peaks (predominantly single-site) and the Compton continuum near QββQββ (which will be the dominant background for most 0νββ0νββ searches). In short, we find total (statistical plus systematic) fractional   uncertainties in the pulse shape cut survival probabilities of: 6.6%, 1.5% and 3.8% for double-escape, continuum and γ‐rayγ‐ray events, respectively.