Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1827647 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2009 | 4 Pages |
Abstract
CsI thin film photocathodes of 600 nm thickness deposited on polished Al surfaces by resistive evaporation technique were studied by angle-resolved X-ray photoelectron spectroscopy (ARXPS), before and after UV-irradiation under vacuum. It is shown that the “UV-irradiated” sample keeps the stoichiometric ratio Cs:I unchanged (1:1) while it shows a higher concentration of carbon in comparison with “as-deposited” samples. The morphology of the “as-deposited” sample is strongly affected after VUV-irradiation. The consequence of such effects on the physical and chemical properties of the “as-deposited” and “UV-irradiated” CsI thin film photocathodes is discussed.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
B.K. Singh, Triloki, P. Garg, A. Prakash, G. Di Santo, E. Nappi, M.A. Nitti, A. Valentini, R. Zanoni,