| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1827783 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2009 | 8 Pages |
Abstract
The paper is a brief overview of the operation principles and the potentials of the scanning photoelectron microscopes (SPEM) and X-ray photoemission electron microscopes (XPEEM) operating at synchrotron facilities. Selected results will illustrate the impact of high spatial resolution for micro-characterization of the surface composition and electronic structure, a key issue for analysis of technologically relevant materials and for fundamental understanding of many unexplored surface phenomena.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Alexei Barinov, Pavel Dudin, Luca Gregoratti, Andrea Locatelli, Tevfik Onur Menteş, Miquel Ángel Niño, Maya Kiskinova,