Pixel detectors for imaging with heavy charged particles

State-of-the-art single quantum counting pixel detectors offer a large potential for different imaging applications. The TimePix pixel device can provide information about position and energy of the detected radiation allowing radiography with charged particles. Heavy charged particles of known initial energy lose their energy partially by going through a specimen material. If the resulting energies of particles passing the specimen are measured, then specimen structure can be revealed. This article shows experimental results of this technique acquired with alpha particles and the TimePix detector. The spatial resolution in detector plane depends on particle energy and can reach submicrometer level. The specimen thickness can be determined with precision up to 320 nm for organic materials if energy loss of individual alpha particle is measured.