| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1829555 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2008 | 7 Pages |
Abstract
A 20 kpixels CdTe sensor has been hybridized on XPAD3S CMOS photon-counting chips, forming a 19,200 pixels imaging device. P-type CdTe with rectifying contact has been employed. This sensor works in hole collection mode with a pulse shaping time of about 150 ns. Detector construction and operation are described, and first results obtained with 241Am source as well as diffraction images using an X-ray synchrotron beam are presented. Polarization effects are present, but remain at a very manageable level.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
S. Basolo, J.F. Bérar, N. Boudet, P. Breugnon, B. Chantepie, J.C. Clémens, P. Delpierre, B. Dinkespiler, S. Hustache, K. Medjoubi, M. Ménouni, C. Morel, P. Pangaud, E. Vigeolas,