| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1829621 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2007 | 4 Pages |
Abstract
We have developed and tested a crystal-optic X-ray fluorescence analyzer, which combines the features of electron-volt energy resolution, large solid angle coverage, and a demonstrated tunability over a photon-energy range from ca. 6.5 to 12 keV. It is based upon the principle of active optics to precisely adjust the shape of a strip of silicon. Although the primary use of the device is in high resolution X-ray spectroscopy, it can also be used for imaging. We present the basic design and two illustrative applications in atomic physics and trace-element analysis.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
B.W. Adams, K. Attenkofer,