Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1829903 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2007 | 4 Pages |
Abstract
A setup for testing silicon position sensitive detectors using a focused pulsed laser beam has been developed. An optical head monitoring the intensity of both incident laser light and reflected light improves long-term stability and reproducibility of measurements. We show that measurements using red (682Â nm) laser light are reliable and robust, providing 4% precision for collected charge determination in our studies. Measurements using infrared light (1055Â nm) are highly sensitive to fine details of detector material properties, which cannot be easily measured and/or compensated for.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Pavel Bažant, Jan Brož, ZdenÄk Doležal, ZbynÄk Drásal, Peter KodyÅ¡, Peter KvasniÄka, Pavel ÅeznÃÄek,