| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1830063 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2007 | 6 Pages |
Abstract
Among the 981 silicon microstrip modules fabricated by the ATLAS SCT Japan group, 111 modules showed a micro-discharge, a rapid leakage current increase when the bias is raised, below 500 V bias at least once in the series of the quality assurance testing. We have conducted a systematic study to understand the causes, including the hot spot localization using an infrared sensitive camera, and measurement of leakage current decay time.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
T. Kuwano, K. Hara, S. Shinma, Y. Ikegami, T. Kohriki, S. Terada, Y. Unno,