| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1831963 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2006 | 5 Pages |
Abstract
The typical dc electronic parameters degradation of SiGe HBT irradiated by reactor pulse neutron and gamma rays were measured. The mechanisms of transient radiation-induced damage in SiGe HBT were preliminary analyzed.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Shu-huan Liu, Dong-sheng Lin, Xiao-qiang Guo, Nan-nan Liu, Xin-biao Jiang, Guang-ning Zhu, Da Li, Zhu-jun Wang, Ben-qi Tang, Wei Chen, Wei Zhang, Hui Zhou, Bei-bei Shao, Jun-li Li,