| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1831973 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2006 | 4 Pages |
Abstract
A new method to correct imperfect bending of curved crystals used for γ-ray diffraction spectroscopy is presented. It relies on using position-sensitive segmented Ge-detectors and permits the determination of the emission area of each γ-ray from the crystals and therefore an off-line correction of bending imperfections as if the crystals were divided into independent 2Ã2 mm2 bent crystals. A first experiment using the GAMS-5 spectrometer (Institut Laue-Langevin) shows proof of the principle of the method.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
T. Materna, B. Bruyneel, J. Jolie, A. Linnemann, N. Warr, H.G. Börner, M. Jentschel, P. Mutti, G. Simpson,