| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1832192 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2006 | 12 Pages |
Abstract
The paper presents detailed noise analysis of detector front-end circuits employing bipolar transistors. The noise models of bipolar transistors are reviewed. Noise analysis of the front-end circuit is performed taking into account noise correlation effects in bipolar transistors. The obtained results on the equivalent noise charge are compared with the measurements performed for the front-end circuit used in the SCTA ASIC. The elaborated formalism of noise analysis is used for the evaluation of noise performance of a front-end circuit employing SiGe heterojunction bipolar transistors.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
J. Kaplon, W. Dabrowski,