| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1832940 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2006 | 4 Pages |
Abstract
In readout electronics for photon-counting pixel detectors, the tight integration between analog and digital blocks causes the readout electronics to be sensitive to on-chip noise coupling. This noise coupling can result in faulty luminance values in grayscale X-ray images, or as color distortions in a color X-ray imaging system. An exploration of simulating noise coupling in readout circuits is presented which enables the discovery of sensitive blocks at as early a stage as possible, in order to avoid costly design iterations. The photon-counting readout system has been simulated for noise coupling in order to highlight the existing problems of noise coupling in X-ray imaging systems. The simulation results suggest that on-chip noise coupling should be considered and simulated in future readout electronics systems for X-ray detectors.
Related Topics
Physical Sciences and Engineering
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Instrumentation
Authors
Jan Lundgren, Suliman Abdalla, Mattias Oâ²Nils, Bengt Oelmann,