| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1833333 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2006 | 7 Pages |
Abstract
The need to understand and reject backgrounds in Ge-diode detector double-beta decay experiments has given rise to the development of pulse shape analysis in such detectors to discern single-site energy deposits from multiple-site deposits. Here, we extend this analysis to segmented Ge detectors to study the effectiveness of combining segmentation with pulse shape analysis to identify the multiplicity of the energy deposits.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
S.R. Elliott, V.M. Gehman, K. Kazkaz, D.-M. Mei, A.R. Young,