| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1861820 | Physics Letters A | 2009 | 6 Pages |
Abstract
A wafer bending stage and a scanning probe microscope are combined to investigate the in situ domain pattern evolution in polycrystalline Bi3.25La0.75Ti3O12 films under stress. We observe the stress induced polarization reorientation that sensitively depends on the relative alignment of the BLT unit cell with respect to the stress.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Physics and Astronomy (General)
Authors
Yi Kan, Yunfei Liu, Oliver Mieth, Huifeng Bo, Xiumei Wu, Xiaomei Lu, Lukas M. Eng, Jinsong Zhu,