Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1862617 | Physics Letters A | 2006 | 4 Pages |
Abstract
Using a highly-sensitive home-made mutual-inductance technique, temperature profiles of the magnetic penetration depth λ(T) in the optimally-doped Sm1.85Ce0.15CuO4 thin films have been extracted. The low-temperature behavior of λ(T) is found to be best-fitted by linear Îλ(T)/λ(0)=ln(2)kBT/Î0 and quadratic Îλ(T)/λ(0)=Îâ1/2Î0â3/2T2 laws above and below T=0.22TC, respectively, which clearly indicates the presence of d-wave pairing mechanism dominated by strong paramagnetic scattering at the lowest temperatures. The best fits produce Î0/kBTC=2.07 and Î/TC=0.25(TC/Î0)3 for the estimates of the nodal gap parameter and impurity scattering rate.
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Authors
A.J.C. Lanfredi, S. Sergeenkov, F.M. Araujo-Moreira,