Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1867797 | Physics Letters A | 2008 | 4 Pages |
Abstract
X-ray phase-retrieval algorithms are widely exploited in contemporary hard x-ray diffraction techniques to image at the nanoscale, less than 10–20 nm. Often reconstruction of the sample shape (image) suffices for the purpose of experiment. Identification of specimen composition requires a quantitative profiling of the complex refractive index. This Letter shows that, although such quantitative analysis is possible in many cases, there is a lower limit to variations in optical density, which can be quantitatively reconstructed using the common phase-retrieval methods.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Physics and Astronomy (General)
Authors
A.Y. Nikulin, R.A. Dilanian, A.V. Darahanau,