Article ID Journal Published Year Pages File Type
1867797 Physics Letters A 2008 4 Pages PDF
Abstract

X-ray phase-retrieval algorithms are widely exploited in contemporary hard x-ray diffraction techniques to image at the nanoscale, less than 10–20 nm. Often reconstruction of the sample shape (image) suffices for the purpose of experiment. Identification of specimen composition requires a quantitative profiling of the complex refractive index. This Letter shows that, although such quantitative analysis is possible in many cases, there is a lower limit to variations in optical density, which can be quantitatively reconstructed using the common phase-retrieval methods.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Physics and Astronomy (General)
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