Development of a Rapid Temperature Scanning System for Pulsed Magnetic Fields and its Applications

An apparatus, which scans temperature in sub-seconds for measuring the temperature dependence of the resistivity, is proposed. This apparatus contains a thermal bath and a sample platform on which a thin-film thermometer and a thin-film heater are sputtered. By thermally isolating the sample platform from surrounding parts, the sample temperature can be scanned at a high sweep rate of 200-300 K/s. As a demonstration of the apparatus, the resistivity of a niobium-titanium alloy is measured in a pulsed magnetic field. In addition, as another application of the apparatus, the dielectric polarization measurement of the quantum-paraelectric material SrTiO3 is described.