Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1868993 | Physics Procedia | 2015 | 4 Pages |
Abstract
We report on the preparation of (11n) oriented thin films of Bi2Sr2CaCu2O8+x (Bi2212), which were fabricated by the metal-organic decomposition method on SrTiO3 (110) and characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM) measurements. By controlling the post-deposition annealing condition (temperature 640 °C ≤ Ta ≤ 780 °C and time 30 min ≤ ta ≤ 120 min), films with only the Bi2212 (117) XRD peak were obtained under the condition Ta = 780 °C and ta = 30 min. Furthermore, by forming films with a double-layer structure, films are found to have better crystallinity. Film properties are discussed on basis of SEM and resistivity measurements.
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