| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1869986 | Physics Procedia | 2015 | 7 Pages |
Abstract
Security holograms are perspective for document and product authenticity protection due to difficulties of such a protection mark falsification. The quality of security holograms and master-matrices significantly depends on perfection of diffraction grating. We represent the quality inspection method of security hologram based on indirect measurements of diffraction grating parameters. The theoretical results of our method application for quality inspection are shown in this paper.
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