| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1871334 | Physics Procedia | 2015 | 5 Pages |
Abstract
For the analysis of surface plasmon resonance influence on ZnO exciton (ultraviolet) luminescence the set of rate equations (SRE) containing a set of parameters that characterizes processes participating in luminescence was proposed. It is shown that utilizing SRE experimental ZnO microstructure radiation intensity dependence on photoexcitation level can be approximated. Thus, the values of SRE parameters can be estimated and used for luminescence analysis. This approach allows treating experimental results for Ag-covered ZnO microfilms exciton luminescence.
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