| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1872284 | Physics Procedia | 2012 | 4 Pages |
Abstract
Polycrystalline BaSrSi2 layers were grown on SiO2 substrates by molecular beam epitaxy, and the local structure of the Sr in the BaSrSi2 films was investigated using extended X-ray absorption fine strcture (EXAFS) analysis. The local structure of the atoms around the Sr is in good agreement with that around Ba, indicating that the Sr atoms substitute for Ba in BaSi2
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