| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1874466 | Physics Procedia | 2015 | 4 Pages |
This contribution presents a method for the simultaneous determination of sound velocity and thickness of a system consisting of two layers. To obtain additional information, beside the time of flight (TOF), the amplitude is evaluated. The amplitude of a reflected sound wave depends on the position of the interface in the sound field of the probe and is maximal, if the focus lies on the interface. The focus position is varied by the use of an annular array and the amplitude as a function of the adjusted focus position is evaluated. Since the sound field of the ring elements of the annular array has distinctly side lobes, transverse waves are excited in the specimen and the sound velocity of the transversal wave can also be determined.The method is demonstrated for the determination of layer thicknesses and sound velocities (longitudinal and transversal) on a two layered system.
