Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1874690 | Physics Procedia | 2014 | 6 Pages |
Abstract
In order to create equivalent images, a series of SEM micrographs of porous silicon were treated with the image analysis procedure, developed using public domain software “ImageJ”. A morphological description was used to reduce the complexity of the microstructure of porous silicon and an image analysis procedure has been established to quantify different geometrical parameters related to the shape, size and orientation distribution. This description allows performing predictive calculation of mechanical properties of porous silicon using finite element analysis. Results are compared with experiment and a good agreement is observed
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