Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1876125 | Applied Radiation and Isotopes | 2012 | 4 Pages |
Abstract
⺠Depth profiling radiological point sources using principal component analysis. ⺠Non-intrusively by deriving a function of depth. ⺠Expanded for different shielding materials. ⺠Depth profiling beyond 50 mm shielding depth also achieved.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
Jamie C. Adams, Malcolm J. Joyce, Matthew Mellor,