Article ID Journal Published Year Pages File Type
1876125 Applied Radiation and Isotopes 2012 4 Pages PDF
Abstract
► Depth profiling radiological point sources using principal component analysis. ► Non-intrusively by deriving a function of depth. ► Expanded for different shielding materials. ► Depth profiling beyond 50 mm shielding depth also achieved.
Keywords
Related Topics
Physical Sciences and Engineering Physics and Astronomy Radiation
Preview
Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50 mm
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