Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1876657 | Applied Radiation and Isotopes | 2009 | 4 Pages |
Abstract
An ion-beam-lithography technique has been progressed in the microbeam systems at Japan Atomic Energy Agency (JAEA) Takasaki. In order to obtain a high-precision measure for microbeam size estimation with a high precision, we applied this technique combined with the electroplating process to make a Ni relief pattern as a resolution standard used in secondary electron imaging. As a result, the smallest beam size could be recorded. The scattering of ions in the materials influenced the spatial resolution and this is also discussed.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
T. Kamiya, H. Nishikawa, T. Satoh, J. Haga, M. Oikawa, Y. Ishii, T. Ohkubo, N. Uchiya, Y. Furuta,