Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1876789 | Applied Radiation and Isotopes | 2009 | 5 Pages |
Abstract
In the realm of X-ray fluorescence (XRF) applications, inhomogeneous distribution of an element can occur as a function of depth within a sample. An example is the measurement of arsenic in skin; arsenic binds with non-uniformly distributed keratin. In this paper, an XRF signal equation based on the fundamental parameter (FP) method, which explicitly takes into account the depth dependence of the elemental concentration, was developed. The formalism was experimentally verified for two-disc resin stacks with different arsenic concentrations.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
Mihai R. Gherase, David E.B. Fleming,