| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1877832 | Applied Radiation and Isotopes | 2011 | 5 Pages |
Abstract
An X-ray scattering method is presented for determining the thickness of an organic film placed on a steel substrate. The strong peaks of characteristic X-rays are taken as an advantage to measure the intensity of backscattered photons. It is shown that the intensity of Compton scattering of characteristic X-rays is proportional to film thickness, up to the thickness of 250 μm of acrylic adhesive layers. In addition, the measurement time was 300 ms, providing a simple and convenient method for on-line for thickness monitoring.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
Jong-Yun Kim, Yong Suk Choi, Yong Joon Park, Kyuseok Song, Sung-Hee Jung, Esam M.A. Hussein,