Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1878088 | Applied Radiation and Isotopes | 2010 | 5 Pages |
Abstract
We introduce a novel method for identifying materials using a series of X-ray diffractograms collected in transmission. A multiple perspective approach is used to identify the diffractograms produced by materials located at different positions along the primary X-ray beam. This technique promises to enhance materials identification performance in cluttered environments such as those prevalent in aviation security screening.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
Anthony Dicken, Keith Rogers, Paul Evans, Joseph Rogers, Jer Wang Chan,