| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1880829 | Radiation Measurements | 2013 | 5 Pages |
The optical and scintillation properties of Nd-doped Lu3Al5O12 (Nd:LuAG) crystals grown by the Czochralski (Cz) method were examined under X-ray excitation. Their applicability for X-ray imaging was also inspected. The radioluminescence spectrum induced by X-rays showed a broad host emission and sharp Nd3+ 4f–4f emission peaks in the UV to visible wavelengths. The light output current of the Nd:LuAG was 85% of that of a standard CdWO4 X-ray scintillator. The afterglow value measured 20 ms after X-ray irradiation was 1.5%. An X-ray radiographic image was successfully obtained using the Nd:LuAG scintillator coupled with the charge coupled device (CCD) photodetector.
► The Nd:LuAG single crystal was produced to perform X-ray imaging test. ► The sample exhibited the 85% light output current of the standard CdWO4. ► The afterglow intensity of the sample was very high compared with the CdWO4. ► The X-ray radiographic image was obtained from the Nd:LuAG single crystal.
