Identification of high energy ions using backscattered particles in laser-driven ion acceleration with cluster-gas targets

A new diagnosis method for high energy ions utilizing a single CR-39 detector mounted on plastic plates is demonstrated to identify the presence of the high energy component beyond the CR-39's detection threshold limit. On irradiation of the CR-39 detector unit with a 25 MeV per nucleon He ion beam from conventional rf-accelerators, a large number of etch pits having elliptical openings are observed on the rear surface of the CR-39. Detailed investigations reveal that these etch pits are created by heavy ions inelastically backscattered from the plastic plates. This ion detection method is applied to laser-driven ion acceleration experiments using cluster-gas targets, and ion signals with energies up to 50 MeV per nucleon are identified.

► We demonstrate a new diagnosis method for high energy ions using CR-39. ► Ions with energies greater than the detection threshold limit of CR-39 can be detected. ► Application to laser-driven ion acceleration experiments identified 50-MeV/u ions.