Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1885080 | Radiation Measurements | 2013 | 4 Pages |
Abstract
A series of atomic force microscopy (AFM) images of etched nuclear tracks has been obtained and used to calculate the nuclear track registration sensitivity parameter V(x) = Vt(x)/Vb. Due to the AFM limitations the samples were irradiated normally to the surface, and with energies attenuated in order to include the Bragg peak region in the AFM piezo-scanner z movement range. The simulation of the track profile evolution was then obtained. The different stages of etched nuclear track profiles were rendered.
► Using AFM we reach that Bragg peak region of etched tracks in CR-39. ► The etched track sensitivity V was calculated by data obtained by AFM. ► The evolucion of etched nuclear tracks was simulated by data achieved by AFM.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
R. Félix-Bautista, C. Hernández-Hernández, B.E. Zendejas-Leal, R. Fragoso, J.I. Golzarri, C. Vázquez-López, G. Espinosa,