Article ID Journal Published Year Pages File Type
1885080 Radiation Measurements 2013 4 Pages PDF
Abstract

A series of atomic force microscopy (AFM) images of etched nuclear tracks has been obtained and used to calculate the nuclear track registration sensitivity parameter V(x) = Vt(x)/Vb. Due to the AFM limitations the samples were irradiated normally to the surface, and with energies attenuated in order to include the Bragg peak region in the AFM piezo-scanner z movement range. The simulation of the track profile evolution was then obtained. The different stages of etched nuclear track profiles were rendered.

► Using AFM we reach that Bragg peak region of etched tracks in CR-39. ► The etched track sensitivity V was calculated by data obtained by AFM. ► The evolucion of etched nuclear tracks was simulated by data achieved by AFM.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Radiation
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