| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1885500 | Radiation Measurements | 2008 | 4 Pages |
Abstract
The effects of UVC exposure on the track etch rate VtVt and the detector sensitivity VV of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate VbVb and VtVt increased but VV decreased. The track diameters and depths were used to derive a VV function for CR-39 detectors with and without UV irradiation.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
K.C.C. Tse, D. Nikezic, K.N. Yu,