Correlation of the dielectric properties and the PSL-sensitivity in CsBr:Eu image plates

The X-ray storage phosphor CsBr:Eu is in the focus of research because of its very high sensitivity of the photostimulated luminescence (PSL). In this contribution, we demonstrate a correlation of the dielectric properties of this material with the PSL-efficiency. The high experimental dielectric constant of the image plate correlates with the high sensitivity of the storage phosphor what has been shown for both thermal annealing and high doses X-ray irradiation. It is our hypothesis that correlation between the dielectric material properties and PSL is due to a stable polarization or, more generally, electric dipoles in the material that improve either the separation of electrons and holes during their generation or their trapping.