Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
189682 | Electrochimica Acta | 2011 | 5 Pages |
Interfacial phenomena involved in the underpotential deposition of tellurium layers were studied with an electrochemical quartz crystal nanobalance (EQCN) in perchloric acid solution (pH = 1). The in situ study of the oxidation kinetics showed that the oxidation of the Te layer deposited neighbor a Teads/Au provides evidence of TeO2ads formation with the incorporation of oxygen to induce the formation of H2TeO3. From the calculations of the first tellurium layer (82 ng cm−2), the mass expected for the second layer deposited in underpotential control was found. Moreover, the oxidation of Teads followed a bi-functional mechanism involving the oxygen incorporated before the tellurium oxidation at high overpotentials. The combination of powerful interfacial methods (cyclic voltammetry and EQCN) gives a new perspective on tellurium electrodeposition and leads to a comprehensive understanding of the interfacial architecture.