Article ID Journal Published Year Pages File Type
272097 Fusion Engineering and Design 2012 6 Pages PDF
Abstract

Tritium exposure experiments were carried out for three kinds of EAST SiC coated doped-graphite (SiC/C) samples, one from the original graphite tiles without being irradiated, and the other two from erosion and deposition areas of first wall after the 2009 campaign in EAST. β-ray-induced X-ray spectrometry (BIXS) was used to characterize the exposed samples. It is showed that the significant amount of tritium was absorbed in the surface of deposition sample in comparison with that of original sample, which was also supported by the results of imaging plate (IP) measurements. In addition, it was found that drastic decrease in tritium retention appeared by lowering exposure temperature, and the trapped tritium was maintained stably with time. Computer simulation is used to analyze the details of depth profile of tritium in different kinds of samples.

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