Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
295783 | NDT & E International | 2008 | 7 Pages |
Abstract
This research analyzes the effect on measurement accuracy when taking X-ray diffraction (XRD) measurements on spherical rather than flat surfaces in the assessment of the proportion of retained austenite and martensite phases. By calculating the difference in X-ray absorption paths between a flat surface and spherical surface, this study demonstrates that only in spherical surfaces of small diameter (⩽0.381 cm) will the difference in X-ray absorption path affect the accuracy of measurements derived from XRD. To improve the accuracy of such measurements, the research presents a model for quantifying the absorption path that X-rays follow when measuring spherical surfaces.
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Authors
Iris V. Rivero, Clayton O. Ruud,