Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4002842 | American Journal of Ophthalmology | 2013 | 10 Pages |
Abstract
Outer retinal layer changes in OCT images can be predicted by analyzing both short-wavelength AF and near-infrared AF images. Abnormal changes in the short-wavelength AF image were predictive of EPIS damage.
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Authors
Sang-Kyoon Kim, Seong-Woo Kim, Jaeryung Oh, Kuhl Huh,