| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 4020304 | Journal of Cataract & Refractive Surgery | 2006 | 7 Pages |
Abstract
Atomic force microscopy was effective and accurate in analyzing IOL optics. The surface topography of IOLs may vary with different manufacturing processes.
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Authors
Marco MD, Maria P. PhD, Giuseppe PhD, Riccardo PhD, Sebastiano MD, PhD,