Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4606458 | Differential Geometry and its Applications | 2010 | 20 Pages |
Abstract
We introduce a systematic study of contact structures with pseudo-Riemannian associated metrics, emphasizing analogies and differences with respect to the Riemannian case. In particular, we classify contact pseudo-metric manifolds of constant sectional curvature, three-dimensional locally symmetric contact pseudo-metric manifolds and three-dimensional homogeneous contact Lorentzian manifolds.
Related Topics
Physical Sciences and Engineering
Mathematics
Analysis
Authors
Giovanni Calvaruso, Domenico Perrone,