Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4625917 | Applied Mathematics and Computation | 2016 | 15 Pages |
Abstract
A finite difference scheme on block-centered method is presented on nonuniform partition to simulate numerically three-dimensional transient problems of semiconductor detector of photoconduction. Applying the method of mixed finite element, the principle of duality, the induction hypothesis, the prior error theory of differential equations and other special techniques, we give error estimates of second-order accuracy in l2-norm. The numerical simulation is super-convergent for the electric field intensity, really important in actual applications.
Related Topics
Physical Sciences and Engineering
Mathematics
Applied Mathematics
Authors
Yirang Yuan, Yunxin Liu, Changfeng Li, Tongjun Sun, Liqin Ma,