Article ID Journal Published Year Pages File Type
4637490 Applied Mathematics and Computation 2006 11 Pages PDF
Abstract

This paper derives the unbiased estimations of the mean life and the failure rate at a design stress based on the failure censored step-stress accelerated life-testing data. An exponential life distribution with a mean that is a log-linear function of stress, and a cumulative exposure model are assumed. The simulation results show that the maximum likelihood estimations of the mean life and the failure rate at the design stress have positive bias, and the unbiased estimations of the mean life and the failure rate at the design stress have smaller mean squared errors than the maximum likelihood estimations of these parameters in small and moderate samples.

Related Topics
Physical Sciences and Engineering Mathematics Applied Mathematics
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