| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 4639456 | Journal of Computational and Applied Mathematics | 2013 | 10 Pages |
An important topic in the manufacturing industries is the assessing of the lifetime performance. In this paper, it is supposed the lifetimes of products are independent and have a common Weibull distribution with a known shape parameter. The lifetime performance index (CLCL) proposed by Montgomery (1985) [1], is used for evaluating the performance of a process with respect to a lower specification limit (LL). The maximum likelihood estimate of CLCL is obtained on the basis of the progressive first-failure censored data. This estimate is then used for developing a confidence interval for CLCL. The behavior of the confidence interval for the parameter CLCL given a significance level is investigated and also two illustrative examples and a sensitivity analysis are given. For the exponential distribution as a special case of Weibull distribution, a comparison study for various estimates of CLCL based on mean squared error (MSE) and Pitman measure of closeness (PMC) criteria is done.
