Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4639623 | Journal of Computational and Applied Mathematics | 2012 | 12 Pages |
Abstract
Kirsch’s factorization method is a fast inversion technique for visualizing the profile of a scatterer from measurements of the far-field pattern. We present a Tikhonov parameter choice approach based on a maximum product criterion (MPC) which provides a regularization parameter located in the concave part of the L-curve on a log–log scale. The performance of the method is evaluated by comparing our reconstructions with those obtained via the L-curve, Morozov’s discrepancy principle and the SVD-tail. Numerical results that illustrate the effectiveness of the MPC in reconstruction problems involving both simulated and real data are reported and analyzed.
Related Topics
Physical Sciences and Engineering
Mathematics
Applied Mathematics
Authors
Fermín S.V. Bazán, J.B. Francisco, Koung Hee Leem, G. Pelekanos,